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  1. 理工学研究科
  2. 理工学研究科・博士論文

RADFETによる宇宙機環境におけるトータルドーズ計測法

http://hdl.handle.net/10232/4896
http://hdl.handle.net/10232/4896
20babddf-5baa-4bbd-aed1-cd3f24b127f5
名前 / ファイル ライセンス アクション
rikouken283.pdf rikouken283.pdf (213.2 kB)
木本.pdf 木本.pdf (3.5 MB)
Item type 学位論文 / Thesis or Dissertation(1)
公開日 2015-03-06
タイトル
タイトル RADFETによる宇宙機環境におけるトータルドーズ計測法
タイトル言語 ja
タイトル
タイトル A total dose measurement technique using RADFETs in spacecraft environment
タイトル言語 en
タイトル
タイトル RADFET ニヨル ウチュウキ カンキョウ ニオケル トータルドーズ ケイソクホウ
タイトル言語 ja-Kana
著者 木本, 雄吾

× 木本, 雄吾

WEKO 125839

ja 木本, 雄吾

ja-Kana キモト, ユウゴ

en Kimoto, Yugo

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言語
言語 jpn
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_db06
資源タイプ doctoral thesis
アクセス権
アクセス権 open access
アクセス権URI http://purl.org/coar/access_right/c_abf2
要約
内容記述タイプ Other
内容記述 This thesis mainly describes a total dose measurement technique using radiation-sensitive field effect transistors (RADFETs) in a spacecraft environment along with flight data analysis results obtained using the technique. A RADFET is a specially designed P-channel metal oxide semiconductor (PMOS) transistor that is optimized for increased radiation sensitivity and which has a thick gate oxide.
Chapter 1 presents the background of this research. The necessity for total dose environment measurement in the spacecraft is explained. One reason is that radiation-hardened electronic parts have become difficult to obtain in light of the increasing use of commercial off-the-shelf products (COTS), which are vulnerable to radiation environments. Another reason is that the design for total dose has been overestimated. For these reasons, total dose measurement techniques to be used inside spacecraft have become important.
Calibration methods for RADFETs are discussed in chapter 2. First, dosimeters, which measure the total dose environment, were investigated. The superiority of RADFETs used in this study was discussed. Gamma-ray irradiation test results were compared to those of electron and proton irradiation tests. Results show that a gamma-ray irradiation technique is used for a standard calibration method for RADFETs used in space. The fading phenomenon (or annealing effect), by which the RADFET voltage decreases with time, was evaluated. The annealing effect can be corrected using a deconvolution technique. Regarding irradiation dispersion, temperature effects on irradiation were analyzed; the measurement error attributable to these factors was discussed.
Chapter 3 presents results of flight data analysis of the Dosimeter (DOS) onboard the Mission Demonstration test Satellite -1 (MDS-1). The MDS-1, launched on 2 February 2002, has experimental devices to verify the function of commercial parts and components, and to collect space environment data. The satellite has a highly elliptical orbit (GTO; Geostationary Transfer Orbit). The MDS-1 flight data were calibrated using the correction technique described in chapter 2. The results were compared with calculation data using the SHIELDOSE-2 based on the space radiation model (AE8 and AP8: standard trapped radiation belt models), and electron and proton data obtained from the on-board radiation spectrometer (SDOM). The model calculation is considered to overestimate the total dose in the shield of less than 2.7 mm thickness. This result might reflect the expanded use of COTS. On the other hand, flight data for the shield thicker than 8 mm shows a greater total dose than the model data. However, the value is lower by a factor of 10 than that for the thinner shield. Therefore, overestimation is not considered to be serious.
A method to use these results in satellite design for total dose is discussed in chapter 4. Design margins are also reported for some shield thicknesses.
Finally, the results of this research are summarized in chapter 5.
内容記述言語 en
要約
内容記述タイプ Other
内容記述 理工学研究科博士論文(理学) ; 学位取得日: 平成20年3月25日
内容記述言語 ja
作成日
日付 2008-03-25
日付タイプ Issued
出版タイプ
出版タイプ VoR
出版タイプResource http://purl.org/coar/version/c_970fb48d4fbd8a85
NDC
主題Scheme NDC
主題 538
ファイル(説明)
内容記述 学位論文の要旨, 学位論文本文
公開者・出版者
出版者 鹿児島大学
出版者言語 ja
公開者・出版者
出版者 Kagoshima University
出版者言語 en
学位記番号
学位記番号 理工研第283号
学位名
学位名の言語 ja
学位名 博士(理学)
学位名
学位名の言語 en
学位名 Doctor of Philosophy in Science
学位授与機関名
学位授与機関識別子Scheme kakenhi
学位授与機関識別子 17701
学位授与機関名の言語 ja
学位授与機関名 鹿児島大学
学位授与年月日
学位授与年月日 2008-03-25
学位授与番号
学位授与番号 甲理工研第283号
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